Low-Capacitance ESD Protection for High-Speed Circuits and Systems
Dr. Chun-Yu Lin
Associate Professor
National Yang Ming Chiao Tung University,
Taiwan
Abstract
Low-Capacitance ESD Protection for High-Speed Circuits and Systems addresses the critical challenge of safeguarding multi-gigabit integrated circuits against Electrostatic Discharge without compromising signal integrity. As operational frequencies rise, standard protection devices introduce parasitic capacitance that degrades high-speed performance. This talk explores advanced ESD topologies, device physics, layout optimizations, and co-design strategies to ensure robust ESD immunity while minimizing parasitic loading.
Biography
Chun-Yu Lin received the Ph.D. degree from the Institute of Electronics, National Chiao Tung University, Taiwan, in 2009. He was the Assistant Professor from 2013 to 2017, Associate Professor from 2017 to 2021, and Distinguished Professor from 2021 to 2024, at the Department of Electrical Engineering, National Taiwan Normal University. Starting from 2024, he relocates to join the Institute of Electronics at National Yang Ming Chiao Tung University. Now, he also serves as the President of Taiwan ESD Association. He authored or co-authored more than 100 conference and journal publications. His current research interests include ESD protection designs and biomimetic circuit designs.
